Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...

The EDA leader has generated over $500M to date in AI tools and technologies. Now a new data analytics solution applies data management, curation, and analysis across the entire pipeline of chip ...

Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

Keysight Technologies Inc. KEYS introduced a comprehensive training and validation solution for neural receivers in collaboration with NVIDIA Corporation NVDA. The cutting-edge 6G neural receiver ...

Semiconductor test equipment supplier Advantest announced that its recently launched ACS Real-Time Data Infrastructure (RTDI) has been accepted by multiple major data-analytics companies. The ...

Two tech trends are having a profound impact on electronics testing and measurement: artificial intelligence and electrification. These systems demand more speed and power than their predecessors, ...

The FlexScan (R) FS300-HDR series brings OTDR testing to new levels with higher dynamic ranges, faster test times and ease of use for all levels of experience. Designed for today and tomorrow's ...

Expands automotive Ethernet software portfolio to address automotive Ethernet multi-gigabit receiver tests Delivers complete validation solution for MultiGBASE-T1 receiver design and characterization ...

The AI and HPC industries are rapidly shifting toward chiplet-based designs to achieve unprecedented levels of performance, as traditional monolithic system-on-chip (SoC) architectures face scaling ...

This strategic move integrates ASTER’s advanced "shift-left" design for test (DFT) functionality directly into Siemens' ...

Migration of data from on-premises to cloud systems or between multiple cloud systems is a common and complex event across companies of all sizes and industries. The types of data being migrated can ...